Dr. Ahmed G. Abo-Khalil

Electrical Engineering Department

Joint Test Action

Joint Test Action Group (JTAG) is the common name for what was later standardized as the IEEE 1149.1 Standard Test Access Port and Boundary-Scan Architecture. It was initially devised for testing printed circuit boards using boundary scan and is still widely used for this application.

Today JTAG is also widely used for ICdebug ports. In the embedded processor market, essentially all modern processors support JTAG when they have enough pins. Embedded systems development relies on debuggers talking to chips with JTAG to perform operations like single stepping and breakpointing. Digital electronics products such as cell phones or a wireless access point generally have no other debug or test interfaces

Office Hours

Monday 10 -2

Tuesday 10-12

Thursday 11-1

My Timetable

Contacts


email: a.abokhalil@mu.edu.sa

a_galal@yahoo.com

Phone: 2570

Welcome

Welcome To Faculty of Engineering

Almajmaah University

IEEE

Institute of Electrical and Electronics Engineers

http://www.ieee.org/

http://ieeexplore.ieee.org/Xplore/guesthome.jsp

http://ieee-ies.org/

http://www.ieee-pes.org/

http://www.pels.org/

Links of Interest

http://www.utk.edu/research/

http://science.doe.gov/grants/index.asp

http://www1.eere.energy.gov/vehiclesandfuels/

http://www.eere.energy.gov/


القران الكريم

http://quran.muslim-web.com/

Travel Web Sites

http://www.hotels.com/

http://www.orbitz.com/

http://www.hotwire.com/us/index.jsp

http://www.kayak.com/

Photovoltaic Operation


Wave Power

World's Simplest Electric Train



PeltierModule-JouleThief-Fridge

homemade Aircondition

Salt water battery


إحصائية الموقع

عدد الصفحات: 2880

البحوث والمحاضرات: 1292

الزيارات: 46927