Dr. Ahmed G. Abo-Khalil

Electrical Engineering Department

Joint Test Action

Joint Test Action Group (JTAG) is the common name for what was later standardized as the IEEE 1149.1 Standard Test Access Port and Boundary-Scan Architecture. It was initially devised for testing printed circuit boards using boundary scan and is still widely used for this application.

Today JTAG is also widely used for ICdebug ports. In the embedded processor market, essentially all modern processors support JTAG when they have enough pins. Embedded systems development relies on debuggers talking to chips with JTAG to perform operations like single stepping and breakpointing. Digital electronics products such as cell phones or a wireless access point generally have no other debug or test interfaces

Office Hours

Monday 10 -2

Tuesday 10-12

Thursday 11-1

My Timetable


Contacts


email: [email protected]

[email protected]

Phone: 2570

Welcome

Welcome To Faculty of Engineering

Almajmaah University


IEEE


http://www.ieee.org/

/

Links of Interest


http://www.utk.edu/research/

http://science.doe.gov/grants/index.asp

http://www1.eere.energy.gov/vehiclesandfuels/

http://www.eere.energy.gov/


Travel Web Sites

http://www.hotels.com/

http://www.orbitz.com/

http://www.hotwire.com/us/index.jsp

http://www.kayak.com/

Blackboard

ستقام اختبارات الميدتيرم يوم الثلاثاء 26-6-1440

حسب الجدول المعلن بلوحات الاعلان

Summer training

The registration for summer training will start from 5th week of second semester

Academic advising

Class registration week 1

برنامج التجسير




إحصائية الموقع

عدد الصفحات: 2879

البحوث والمحاضرات: 1280

الزيارات: 63966