Publications

A. Khaled, M. Raoof, V. Cherman , K. Jans , M. Abbas, Sh. Ebrahim, G. Bryce, P. Verheyen , A. Witvrouw  and De Wolf, “Effect of the functionalization process on the performance of SiGe MEM resonators used for bio-molecular sensing”, Microelectronics Reliability vol. 52 issue 9-10 September - October, 2012. p. 2272-2277 

M. Abbas “Feedforward Compensation Technique for comparator delay dispersion for level-crossing ADCs”, Journal of Electrical Science (JES) Faculty of Engineering, May 2012.,Assiut University, Egypt

M. Abbas, M. Ikeda and K. Asada,” On-chip detector for single-event noise sensing with voltage scaling function” IEICE TRANS. VOL. E89-C NO.3 March 2006, pp. 370-376.

M. Abbas, M. Ikeda and K. Asada,” Noise Immunity Investigation of Low power Design schemes” IEICE TRANS., VOL. E89-C. NO.8 August 2006.

M. El-Sayed and M. Abbas,  “Optimization of Arbitrarily Doped MINP+ as Solar Cell” Journal of Renewable Energy Vol. 14 No. 1-4-1998, pp. 141-147.

M. Abbas, “An Automatic Test Generation Framework for Adaptive Mixed-Signal Systems” Invited Talk @ Advantest Research and Development Laboratory, Gunmma, Japan January 2010.

M. Abbas, “Cost-Effective Test Methodology for Analog and Mixed-Signals in SoCs”, Invited Talk @ D2T Symposium, VDEC. The university of Tokyo, Japan, June 2010.  

Takahiro J. Yamaguchi, Kunihiro Asada, Kiichi Niitsu, Mohamed Abbas, Satoshi Komatsu1, Haruo Kobayashi, Jose A. Moreira, “A New Procedure for Measuring High-Accuracy Probability Density Functions”, Accepted for Presentaion in IEEE ATS 2012, Nov. 2012, Niigata, Japan

K. Khalil, M. Abbas and M. Abdel-Gawad, “Novel Technique for Reducing the Comparator Delay Dispersion in 45nm CMOS Technology for Level-Crossing ADCs”, IEEE ISCDG2012, Sept. 2012, Grenoble- France

M. Zanaty, R. Jansen, V. Rochus, M. Abbas, A. Witvrouw,  H. A. C. Tilmans, X. Rottenberg, “Influence of the nonlinearity introduced by the van der Waals forceon the behaviour of NEM resonators  “,The 23rd Micromechanics and Microsystems  Europe Workshop (MME 2012), September, 2012 Ilmenau, Germany.

T. J. Yamaguchi, S. Komatsu1, M Abbas, K. Asada1, N. Khanh and J. Tandon, “CMOS Flash TDC with 0.84 – 1.3 ps Resolution Using Standard  Cells”, RFIC 2012, June 2012, Montreal- Canada.

M. Abbas, T. J. Yamaguchi, Y Furukawa, S. Komatsu and K. Asada,” Low Delay Dispersion Comparator for Level-Crossing ADCs”, Procedddings of IEEE JECECC2012, March-2012, Alexanderia, Egypt. (Best paper of the conference)

M. Abbas, “Fault Detection and Diagnoses Methodology for Adaptive Digitally-Calibrated Pipelined ADCs”, Proceedings of IEEE IDT2011, Beirut, Lebanon, Dec. 2011

M. Abbas, T. J. Yamaguchi, Y Furukawa, S. Komatsu and K. Asada,” Novel Technique for Minimizing the Comparator Delay Dispersion in 65nm CMOS Technology”, Proceedings of IEEE ICECS2011, Beirut, Lebanon, Dec. 2011

T.J. Yamaguchi, M. Soma, T. Aoki, Y. Furukawa, K. Degawa, K. Asada, M. Abbas, S. Komatsu,” Application of a Continuous-Time Level Crossing Quantization Method for Timing Noise Measurements”, ITC2011.

T. J. Yamaguchi, M. Abbas et al , “An Equivalent-Time and Clocked Approach for Continuous-Time Quantization”, ISCAS2011, Rio de Janeiro, RJ – BRAZIL, May 2011.

M. Abbas, Y. Furukawa, S. Komatsu , T. J. Yamaguchi and K. Asada, “Clocked Comparator for High-Speed Applications in 65nm Technology”, A-SSCC2010, China, Beijing, November 2010.

M. Abbas, K-T. Cheng, Y. Furukawa, S. Komatsu and K. Asada, "An Automatic Test Generation Framework for Digitally-Assisted Adaptive Equalizers in High-Speed Serial Links ", DATE2010, Germany, Dresden, March-2009.

M. Abbas, Y. Furukawa, S. Komatsu and K. Asada, "Signature-Based Testing for Adaptive Digitally-Calibrated Pipelined Analog-to-Digital Converters", IEEE ASICON09, Changsha, China October-2009.

M. Abbas, K-T. Cheng, Y. Furukawa, S. Komatsu and K. Asada," GA-Based Test Generation for Digitally-Assisted Adaptive Equalizers in High-Speed Serial Links", IEEE EWDTS, Moscow, Russia, September-2009.

M. Abbas, K-T. Cheng, Y. Furukawa, S. Komatsu and K. Asada, “Signature-Based Testing for Digitally-Assisted Adaptive Equalizers in High-Speed Serial Links”, IEEE Europian Test Symposium, ETS09, Sivilla, Apain, May-2009.

M. Abbas, M. Ikeda and K. Asada,” On-chip 8GHz Non-Periodic High-Swing Noise Detector” Proceedings of DATE 2006 , Germany, Munich, March-2006

M. Abbas, M. Ikeda and K. Asada,”Statistical Model for Logic Errors in CMOS Digital Circuits for Reliability-Driven Design Flow” Proceedings of DDECS06, Czech Republic, Prague, April-2006.

M. Abbas, M. Ikeda and K. Asada,” On-chip Detector for Non-Periodic High-Swing Noise Detection” Proc. of Int. SoC Design Conf. pp: 231-234, S. Korea, Seoul, October-2005.

M. Abbas, M. Ikeda and K. Asada,” On-chip Non-Periodic High-Swing Noise Detector”  Proc. of 12th IEEE Int. Conf. on Electronics, Circuits and System, Tunisia , Tunis, December 2005.

M. Abbas, M. Ikeda and K. Asada, “Noise Effects on Performance of Low Power Design Schemes in Deep Submicron Regime” the 19th IEEE Int. Symp. On Defect and Fault Tolerance in VLSI, France, Cannes, October-2004.

M. Abbas, M. Ikeda and K. Asada, “On High Noise Immunity CMOS Design Scheme with Low Leakage Power Consumption”, 7th Int. Conf. on Solid-State and Integrated Circuit Technology, China, Beijing, October-2004.

M. A. El-Sayed and M. Abbas,  “Effect of Temperature on the Performance of MINP   Solar Cell” Sharjah  Solar Energy conference, United Arab Emarat,Sharjah, February- 2000.

M. A. El-Sayed and M. Abbas,  “A Numerical Model for Arbitrarily Doped MINP  Semiconductor Device as Solar Cell”, Middel East Power Conference,  EGYPT, Luxor, January-1996.

M. Abbas “Toward High-Speed Level-Crossing ADCs”, 8th International Conference on Electrical Engineering, Cairo, Egypt, May 2012.

M. Abbas, M. Ikeda and K. Asada ,” Statistical Evaluation of Logic Errors in Low Power Design Schemes”, IEICE national Conf. 2004, Japan 2004

M. Abbas, M. Ikeda and K. Asada, “On-chip Detector for Non-Periodic High-Swing Noise Sensing”, IEICE national Conf. 2005, Japan 20~23-Sept. 2005.

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الساعات المكتبية

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عدد الصفحات: 11

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